发明名称 NORMAL-TEMPERATURE JOINT METHOD, EQUIPMENT, AND DEVICE
摘要 PROBLEM TO BE SOLVED: To solve problem such as low production efficiency for long time required for conventional heating joint or anode joint at glass-Si joint, or device fault such as warping for thermal expansion. SOLUTION: After applying surface activation to joint surface of the joint objects by atomic beams, ion beams or energy waves (plasma), this solution separates the device to be temporarily joined at normal temperature from a device to be joined completely by heating and lines up multiple joint devices. In addition, this solution temporarily joins two glasses at both sides of devices to be encapsulated from both sides and then joins them by heating without warping. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006073780(A) 申请公布日期 2006.03.16
申请号 JP20040255157 申请日期 2004.09.02
申请人 BONDOTEKKU:KK 发明人 OKADA MASUAKI
分类号 H01L21/02 主分类号 H01L21/02
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