发明名称 Multiple dielectric FinFet structure and method
摘要 Disclosed is a method and structure for a fin-type field effect transistor (FinFET) structure that has different thickness gate dielectrics covering the fins extending from the substrate. These fins have a central channel region and source and drain regions on opposite sides of the channel region. The thicker gate dielectrics can comprise multiple layers of dielectric and the thinner gate dielectrics can comprise less layers of dielectric. A cap comprising a different material than the gate dielectrics can be positioned over the fins.
申请公布号 US2006054978(A1) 申请公布日期 2006.03.16
申请号 US20050264446 申请日期 2005.11.01
申请人 发明人 CLARK WILLIAM F.JR.;NOWAK EDWARD J.
分类号 H01L29/76;H01L21/336;H01L21/84;H01L29/423;H01L29/786;H01L29/94 主分类号 H01L29/76
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