| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC tester that does not require a formatter every tested object when two or more tested objects are tested. SOLUTION: The IC tester for simultaneously testing two or more tested objects is improved. The tester comprises the formatter for outputting a test signal, a latch circuit that is disposed every tested object, inputs the output of the formatter, and outputs it through or outputs it while holding it, and a driver for inputting the output of the latch circuit and outputting it to the tested object. COPYRIGHT: (C)2006,JPO&NCIPI
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