| 摘要 |
PROBLEM TO BE SOLVED: To provide a semi-conductor testing device capable of performing timing calibration using a timing calibration means having one analog comparator. SOLUTION: The semi-conductor testing device applies positive and negative polar differential signals and a single signal as test signals to a DUT. As the timing calibration means of these test signals, a common analog comparator for detecting a cross point of the differential signals and comparing the single signal with a reference voltage is provided. COPYRIGHT: (C)2006,JPO&NCIPI
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