IEEE STD.1149.4 COMPATIBLE ANALOG BIST METHODOLOGY
摘要
<p>An analog built-in self-test (BIST) methodology based on the IEEE 1149.4 mixed signal test bus standard. The on-chip generated triangular stimuli are transmitted to the analog circuit under test (CUT) through the analog test buses, and their test responses are quantized by the dual comparators. The quantized results are then fed into a pair of counters to record the sampled counts for comparison in the decision circuit. A pass/fail indication is then generated in the decision circuit to indicate success or failure of the CUT after the BIST operation is complete.</p>
申请公布号
WO2006028857(A2)
申请公布日期
2006.03.16
申请号
WO2005US30999
申请日期
2005.08.31
申请人
SYNTEST TECHNOLOGIES, INC.
发明人
SU, CHAUCHIN;LIN, SHYH-HORNG;WANG, LAUNG-TERNG (L-T.)