发明名称 SAMPLE HOLDING PROBE AND MANUFACTURING METHOD OF SAMPLE
摘要 PROBLEM TO BE SOLVED: To provide a sample holding probe capable of sufficiently suppressing deformation/denaturation in processing an object to be processed; and to provide a manufacturing method of a sample. SOLUTION: This sample holding probe is provided with a probe body having a sample holding part for holding the sample, and a cooling part for cooling the probe body. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006073270(A) 申请公布日期 2006.03.16
申请号 JP20040253127 申请日期 2004.08.31
申请人 TDK CORP 发明人 TANAKA MICHI
分类号 H01J37/20;G01N1/28 主分类号 H01J37/20
代理机构 代理人
主权项
地址