Solid-state image pickup device, method for transferring charge in solid-state imaging device and method for manufacturing solid-state imaging device

摘要

The present invention solves a smear problem caused by mixing of a noise signal with signal electric charge being transferred in an operation to transfer the signal charge obtained as a result of a process carried out on a received light beam having a large wavelength. In order to solve the problem, the present invention provides a solid-state image pickup device including a layered structure which includes photosensors and an electric-charge transfer section. The photosensors include a first photosensor ( 21 ) and a second photosensor ( 22 ) for receiving a light beam with a wavelength smaller than the wavelength of a light beam received by the first photosensor ( 21 ). The first photosensor ( 21 ) and the second photosensor ( 2 ) are provided at adjacent locations separated away from each other by a potential barrier section ( 12 ). A read gate ( 42 ) provided beneath the first photosensor ( 21 ) transports electric charge obtained as a result of a process carried out by the first photosensor ( 21 ) to an electric-charge transfer section ( 50 ) provided beneath the second photosensor ( 22 ).