发明名称 Memory devices having a resistance pattern and methods of forming the same
摘要 Memory devices include a semiconductor substrate and a device isolation layer in the substrate and defining a cell region and a resistance region. A resistance pattern is disposed on the device isolation layer in the resistance region. An interlayer insulating layer is on the resistance pattern and a resistance contact hole with a contact plug therein extends through the interlayer insulating layer and exposes the resistance pattern. A conductive pad pattern is interposed between the resistance pattern and the device isolation layer that is electrically connected to the resistance pattern. The conductive pad pattern is positioned between the resistance contact hole and the device isolation layer and has a planar area greater than a planar area of the resistance pattern exposed by the resistance contact hole. The conductive pad pattern and the resistance pattern define a resistor of the memory device having a greater thickness in a region including the conductive pad pattern.
申请公布号 US2006054953(A1) 申请公布日期 2006.03.16
申请号 US20050222196 申请日期 2005.09.08
申请人 SON SUK-JOON;PARK JIN-TAEK;PARK JONG-HO 发明人 SON SUK-JOON;PARK JIN-TAEK;PARK JONG-HO
分类号 G03G15/02;H01L29/94 主分类号 G03G15/02
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