| 摘要 |
<p>A sensor probe provides a pair of unique signal paths through a test material, wherein one configuration of the p robe provides identical external portions of the signal paths such that a selected parameter of a measuring signal passing along at least two of the unique signal paths is measured. From these measurements, a method is provided for calculating at least one parameter of the test material, wherein the parameter can include an intrinsic parameter as well as a condition of state.</p> |
