发明名称 |
Method and device for calibration sensors |
摘要 |
A method and device are disclosed for calibrating sensors, which sensors are arranged on semiconductor chips and are e.g. to be used for detecting a substance in a fluid. The sensors are calibrated while they are still assembled on a semiconductor wafer by exposing the wafer to a calibration fluid containing a known amount of the substance to be measured. Hence, rather than first cutting the wafer, the sensors are calibrated at an early stage. For this purpose, they are placed on a chuck below a lid. The calibration fluid with known parameters is introduced between the wafer and the lid. This allows to test and calibrate a large number of sensors quickly.
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申请公布号 |
US2006053862(A1) |
申请公布日期 |
2006.03.16 |
申请号 |
US20050195467 |
申请日期 |
2005.08.01 |
申请人 |
MAYER FELIX;DESCHLER MATHIAS;ROTHACHER URS;HUMMEL RENE |
发明人 |
MAYER FELIX;DESCHLER MATHIAS;ROTHACHER URS;HUMMEL RENE |
分类号 |
G01N37/00;G01K15/00;G01N33/00;H01L21/66 |
主分类号 |
G01N37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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