发明名称 Lateral MOS device with minimization of parasitic elements
摘要 A lateral MOS device is formed in a body having a surface and is formed by a semiconductor layer of a first conductivity type; a drain region of a second conductivity type, formed in the semiconductor layer and facing the surface; a source region of the second conductivity type, formed in the semiconductor layer and facing the surface; a channel of the first conductivity type, formed in the semiconductor layer between the drain region and the source region and facing the surface; and an insulated gate region, formed on top of the surface over the channel region. In order to improve the dynamic performance, a conductive region extends only on one side of the insulated gate region, on top of the drain region but not on top of the insulated gate region.
申请公布号 US2006054954(A1) 申请公布日期 2006.03.16
申请号 US20050223796 申请日期 2005.09.08
申请人 STMICROELECTRONICS S.R.I. 发明人 SANTANGELO ANTONELLO;CASCINO SALVATORE;GERVASI LEONARDO
分类号 H01L29/94;H01L21/336;H01L29/06;H01L29/10;H01L29/417;H01L29/78 主分类号 H01L29/94
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