发明名称 METHOD FOR MANUFACTURING MASK BLANK AND METHOD FOR MANUFACTURING MASK
摘要 <p><P>PROBLEM TO BE SOLVED: To suppress the occurrence of a defect in the base of a thin film (mask layer). <P>SOLUTION: The method for manufacturing a mask blank having a thin film as a mask layer formed on a light transmitting substrate 10, the thin film to be used as a mask layer for patterning a base (halftone film 12) by etching, is characterized in that: the thin film comprises a plurality of layers (light shielding films 14, 16); the thin film is formed in a plurality of steps by each layer; and the surface of each layer is cleaned every time of forming the layer of the thin film. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006071870(A) 申请公布日期 2006.03.16
申请号 JP20040253986 申请日期 2004.09.01
申请人 HOYA CORP 发明人 OKUBO YASUSHI
分类号 G03F1/32;G03F1/54;H01L21/027 主分类号 G03F1/32
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