发明名称 PIXEL TESTING METHOD, METHOD OF CORRECTING OUTPUT VOLTAGE OF PIXEL, DEVICE, PROGRAM, AND METHOD FOR PROCESSING DEFECTIVE PIXEL, AND RECORDING MEDIUM WITH PROGRAM RECORDED THEREON
摘要 PROBLEM TO BE SOLVED: To solve the problem that a defective pixel cannot be detected by a conventional pixel testing method when adjacent pixels and peripheral pixels are not in the same color. SOLUTION: The pixel testing method tests whether or not a pixel to be tested in a photoelectric transducer where pixels of the same color are adjacent is a defective pixel. The method includes: detecting a first voltage difference between two voltages output from the tested pixel and first first color pixels adjacent to first second color pixels which is one of the at least two second color pixels; detecting a second voltage difference between two voltages output from first second color pixels and second second color pixels other than the first second color pixel among the at least two second color pixels; and determining whether the tested pixel is a defective pixel based on the first voltage difference and the second voltage difference. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006074734(A) 申请公布日期 2006.03.16
申请号 JP20050197789 申请日期 2005.07.06
申请人 SEIKO EPSON CORP 发明人 ARASAKI SHINICHI
分类号 H04N5/335;H04N5/341;H04N5/345;H04N5/367;H04N5/374 主分类号 H04N5/335
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