| 摘要 |
PURPOSE:To facilitate replacement of a defective semiconductor pellet when the defective semiconductor pellet is detected after aging by a method wherein semiconductor pellets are mounted only on the acceptable blocks among a plurality of mother chip blocks and electrically connected to the electrodes of those blocks with wires between source system wirings and power is supplied to the semiconductor pellets through the wires to age the pellets. CONSTITUTION:A wafer 1 is made of single crystal silicon and a plurality of mother chip blocks 2 are formed on it. Acceptable blocks only are screened out by the continuity tests of the wirings formed in those blocks 2. Moreover, source system wiring layers composed of source wiring layers 5 and ground wiring layers 6 are provided in dicing regions between and around adjacent blocks 2. With this constitution, semiconductor pellets 4 are mounted on the acceptable blocks 2 only and can be aged easily by supplying power to them through the source system wirings 5 and 6. When a defective semiconductor pellet is detected as a result of aging, as the pellets are not packaged yet, the detective pellet can be replaced easily. |
