发明名称 METHOD AND APPARATUS FOR FABRICATING LOW-K DIELECTRICS, CONDUCTING FILMS, AND STRAIN-CONTROLLING CONFORMABLE SILICA-CARBON MATERIALS
摘要 <p>A method for fabricating a semiconductor device having a plurality of layers, depositing a first layer comprising a medium-k dielectric barrier layer on one of the plurality of layers, depositing a second layer comprising a low-k dielectric layer on the first layer, and depositing a third layer comprising a medium-k dielectric barrier on the second layer.</p>
申请公布号 WO2006029388(A2) 申请公布日期 2006.03.16
申请号 WO2005US32382 申请日期 2005.09.09
申请人 NANODYNAMICS, INC.;DORFMAN, BENJAMIN 发明人 DORFMAN, BENJAMIN
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
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