发明名称 THERMAL ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide a thermal analyzer obtaining electromagnetic wave data from a specimen without omission by means of smaller storage capacity and allopwing easy association of an electromagnetic wave detection result with a thermal analysis result. SOLUTION: An electromagnetic wave data acquisition control means 6 determines whether electromagnetic wave data agree with trigger conditions set by an electromagnetic wave data acquisition trigger setting means 7 and the wave data are acquired when agreement takes place. An electromagnetic wave data association means 10 associates positions on thermal analysis data with the wave data when a trigger is generated. By using a result thereof, an electromagnetic wave data determining means 14 determines electromagnetic wave data corresponding to the positions on designated thermal analysis data. Electromagnetic wave data are outputted in the vicinity of the thermal analysis data. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006071541(A) 申请公布日期 2006.03.16
申请号 JP20040257133 申请日期 2004.09.03
申请人 SII NANOTECHNOLOGY INC 发明人 NAKATANI RINTARO
分类号 G01N25/20 主分类号 G01N25/20
代理机构 代理人
主权项
地址