发明名称 |
Epitaxial wafer and device |
摘要 |
<p>An epitaxial wafer and a device having improved characteristics are obtained. The epitaxial wafer includes a substrate (3), a buffer layer (9) formed on the substrate (3), a light-receiving layer (11) formed on the buffer layer (9), and a window layer (13) The light-receiving layer (11) is constituted of an epitaxial film having its lattice constant larger than that of a material of which the substrate (3) is made. The window layer (13) is formed on the light-receiving layer (11) and constituted of one or a plurality of layers arranged to contact the light-receiving layer (11). A constituent layer of the window layer (13) that is in contact with the light-receiving layer (11) has its lattice constant smaller than the larger one of respective lattice constants of the light-receiving layer (11) and the buffer layer (9). The window layer (13) has a thickness of at least 0.2 µm and at most 2.0 µm.</p> |
申请公布号 |
EP1635401(A1) |
申请公布日期 |
2006.03.15 |
申请号 |
EP20050019376 |
申请日期 |
2005.09.06 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
SAWADA, SHIGERU;IWASAKI, TAKASHI |
分类号 |
H01L31/0304 |
主分类号 |
H01L31/0304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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