发明名称 Method of manufacturing thin film transistor
摘要 After a polysilicon semiconductor film 5 and a first gate oxide film 6 are formed on a transparent insulating substrate 1, the semiconductor film 5 and the first gate oxide film 6 are patterned into an island shape to form an island part. At this time, an overhang part 8 of a visor shape is formed where side end surfaces of the first gate oxide film 6 and the semiconductor film 5 are not aligned and an end part of the first gate oxide film 6 projects slightly from a position of a side end surface of the semiconductor film 5. The overhang part 8 is removed, for example, during cleaning, which thus enhances yield.
申请公布号 US7011996(B2) 申请公布日期 2006.03.14
申请号 US20030444288 申请日期 2003.05.22
申请人 NEC CORPORATION 发明人 OKUMURA HIROSHI;SHIOTA KUNIHIRO
分类号 G02F1/1368;H01L21/335;H01L21/20;H01L21/308;H01L21/336;H01L21/8232;H01L29/49;H01L29/786 主分类号 G02F1/1368
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