发明名称 Method of measuring AC residual image in a liquid crystal display device
摘要 A pair of substrates and a liquid crystal layer held between the pair of substrates are provided, at least one of the pair of substrates has plural electrodes for applying an electric field approximately parallel to the substrate to the liquid crystal layer, a protecting film for protecting at least one of the plural electrodes and oriented films or the electrodes, and an AC residual image of the oriented film is less than 8% to thereby enable high quality image display upon eliminating display defects caused by the AC residual image.
申请公布号 US7012668(B2) 申请公布日期 2006.03.14
申请号 US20050129384 申请日期 2005.05.16
申请人 HITACHI, LTD. 发明人 KOBAYASHI SETSUO;YANAGAWA KAZUHIKO
分类号 G02F1/13;G02F1/1333;G02F1/1337;G02F1/1339;G02F1/1343 主分类号 G02F1/13
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