IC with internal interface switch for testability

摘要

A semiconductor integrated circuit which is provided with a shift scan path incorporated in each function module and a testing I/O terminal connected to a shift scan path and provided separately from a normal-operation-use I/O terminal, and which comprises, all formed on one semiconductor chip, a bus interface circuit for connecting normal-operation-use I/O terminals of a plurality of function modules to a bus, an external interface switching circuit which switches between the bus-side I/O terminal of the bus interface circuit and the testing I/O terminal of each function module for connection to an external terminal and an interface control circuit for switch-controlling the external interface switching circuit.