发明名称 Method, program, and apparatus for designing a semiconductor device
摘要 A method for designing a semiconductor device in which dummy pattern density and design pattern density are equalized on the entire semiconductor chip. A layout pattern for a layout layer in a semiconductor device is divided into divided areas (step S1). A dummy pattern is inserted between design patterns in the divided areas obtained by dividing the layout pattern (step S2). Dummy pattern density and design pattern density in each divided area are calculated (step S3). Pattern rules for a dummy pattern in each divided area are changed so that the dummy pattern density and the design pattern density will be desired values (step S4).
申请公布号 US7013446(B2) 申请公布日期 2006.03.14
申请号 US20030606951 申请日期 2003.06.27
申请人 FUJITSU LIMITED 发明人 OHBA HISAYOSHI;WATANABE JUN
分类号 G06F17/50;H01L21/768;H01L21/82;H01L21/822;H01L23/528;H01L27/04 主分类号 G06F17/50
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