发明名称 Method and apparatus for polishing workpiece
摘要 A workpiece such as a semiconductor wafer is polished by pressing the workpiece against a polishing surface under a predetermined pressure. A polished surface of the workpiece is processed by pressing the workpiece against a processing surface under a predetermined pressure while the processing surface makes circulatory translational motion along a predetermined path. The processing surface comprises a surface of a polishing cloth or a surface of an abrading plate, and the polished surface of the workpiece is further polished or cleaned.
申请公布号 US7011569(B2) 申请公布日期 2006.03.14
申请号 US20020134513 申请日期 2002.04.30
申请人 EBARA CORPORATION 发明人 SHIMIZU NOBURU;KIMURA NORIO
分类号 B24B1/00;B08B1/04;B24B27/00;B24B37/04;H01L21/00;H01L21/306;H01L21/687 主分类号 B24B1/00
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