| 摘要 |
PROBLEM TO BE SOLVED: To provide a laser emission spectral analyzing method which enables reconcilation of high wavelength resolving power and a wide measuring wavelength region at the time of laser emission spectrum analysis, and a rapid and precise measurement of a concentration of a component element in a steel material even on a machine side of analysis marked in fluctuations of a measuring environment. SOLUTION: At the time of analysis of the component element in an analytical sample by a laser emission spectral analyzing method, at least the peak position of one exciting light is calculated as the pixel position on a CCD detector prior to analysis under analyzing environment and this pixel position is compared with the fundamental pixel position on the CCD detector of a preliminarily calculated exciting light to correct the pixel position with respect to all of exciting lights used in analysis. COPYRIGHT: (C)2006,JPO&NCIPI
|
