发明名称 Insulated gate semiconductor device and method of manufacturing insulated gate semiconductor device
摘要 Disclosed is an insulated gate semiconductor device comprising: a first region having a gate electrode region and a first insulating film region surrounding the gate electrode region; a semiconductor region which includes a channel forming region and is disposed to oppose the gate electrode region with the first insulating film region between them; and a second region which has a conductor region buried in a semiconductor region not including the channel forming region disposed to oppose the gate electrode region with the first insulating film region between them, and has a second insulating film region which separates the conductor region from the semiconductor region.
申请公布号 US2006049456(A1) 申请公布日期 2006.03.09
申请号 US20050216014 申请日期 2005.09.01
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SUGIYAMA KOICHI
分类号 H01L21/336;H01L29/94 主分类号 H01L21/336
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