A probe (10) for a probe card assembly is provided. The probe includes a beam element (12) having a tip end portion. The probe also includes a tip structure (18) on the tip end portion of the beam element. The tip structure includes a plurality of conductive bumps (20, 22) arranged in a stacked configuration.
申请公布号
WO2006026346(A1)
申请公布日期
2006.03.09
申请号
WO2005US30233
申请日期
2005.08.25
申请人
K & S INTERCONNECT, INC.;WILLIAMS, SCOTT, R.;SHUHART, JOHN;SLOPEY, ALAN
