发明名称 METHOD FOR MANUFACTURING DIELECTRIC THIN-FILM CAPACITOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a dielectric thin-film capacitor by which such a dielectric thin-film capacitor can be obtained that has a smooth surface, less cracking and a high dielectric constant. <P>SOLUTION: The method for manufacturing a dielectric thin-film capacitor includes a step to form a lower conductor 30 on a substrate 10, a step to form a precursor film by applying a material solution to the lower conductor 30, a step wherein first heat treatment is conducted at a temperature 50-150&deg;C higher than the crystallization temperature of the precursor film to crystallize the precursor film so as to form a dielectric thin film 40, a step to form upper conductors 51 and 52 on the dielectric thin film 40, and a step to conduct second heat treatment at a temperature higher than that of the first heat treatment by 100&deg;C or more. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006066542(A) 申请公布日期 2006.03.09
申请号 JP20040245776 申请日期 2004.08.25
申请人 MURATA MFG CO LTD 发明人 SHIBUYA MITSUKI;TAKESHIMA YUTAKA
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/108 主分类号 H01L27/04
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