发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor memory device, having high accuracy of reading data, utilizing the polarization state of a ferroelectric film. SOLUTION: In reading data, corresponding to the polarization state from the ferroelectric film 22 that can generate upward or downward residual polarization, a bias voltage is applied to a control gate electrode 23, to read the data. For example, supposing that the state that downward residual polarization exists represents data "1", and the state that upward or almost zero residual polarization exists represents data "0". In particular, by defining that the state that almost zero residual polarization exists represents data "0", the precision of reading is enhanced since the read current for data "0" is almost constant. Also the precision of reading is further improved, if imprinting is induced to one piece of the data (for example, data "1") in advance. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006066932(A) 申请公布日期 2006.03.09
申请号 JP20050314410 申请日期 2005.10.28
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SHIMADA YASUHIRO;KATO TAKEHISA;YAMADA TAKAYOSHI
分类号 H01L27/105;G11C11/22;H01L21/8246;H01L21/8247;H01L29/788;H01L29/792 主分类号 H01L27/105
代理机构 代理人
主权项
地址