发明名称 Method for making a semiconductor device that includes a metal gate electrode
摘要 A method for making a semiconductor device is described. That method comprises forming on a substrate a dielectric layer and a sacrificial structure that comprises a first layer and a second layer, such that the second layer is formed on the first layer and is wider than the first layer. After the sacrificial structure is removed to generate a trench, a metal gate electrode is formed within the trench.
申请公布号 US2006051957(A1) 申请公布日期 2006.03.09
申请号 US20040936114 申请日期 2004.09.07
申请人 BRASK JUSTIN K;KAVALIEROS JACK;DOCZY MARK L;METZ MATTHEW V;DATTA SUMAN;SHAH UDAY;DOYLE BRIAN S;CHAU ROBERT S 发明人 BRASK JUSTIN K.;KAVALIEROS JACK;DOCZY MARK L.;METZ MATTHEW V.;DATTA SUMAN;SHAH UDAY;DOYLE BRIAN S.;CHAU ROBERT S.
分类号 H01L21/4763 主分类号 H01L21/4763
代理机构 代理人
主权项
地址