发明名称 Method of manufacturing thin film semiconductor device, and thin film semiconductor device
摘要 TFTs are formed on a substrate, and a layer insulation film containing no hydroxyl group in at least a lowermost layer film is formed in the state of covering the TFTs. Thereafter, a heat treatment is conducted in a moisture atmosphere, whereby oxygen or hydrogen is bound to dangling bonds present in a semiconductor thin film constituting the TFTs, and an enhancement of the denseness of the layer insulation film is contrived. The layer insulation film includes silicon nitride, for example.
申请公布号 US2006051903(A1) 申请公布日期 2006.03.09
申请号 US20050196109 申请日期 2005.08.03
申请人 SONY CORPORATION 发明人 KUNII MASAFUMI
分类号 H01L21/8232;H01L21/335 主分类号 H01L21/8232
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