发明名称 SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To allow the peripheral portion of a semiconductor substrate to be polished by an appropriate amount without causing a lack of polishing or excessive polishing. <P>SOLUTION: A substrate processing method is used to polish the peripheral portion of a semiconductor substrate 13. The substrate processing method comprises: a process of bringing the polishing surface of a polishing mechanism 20 into contact with the principal surface of the peripheral portion of the substrate 13, and pressing the polishing surface against the principal surface; a process of polishing the principal surface by rotating the substrate 13 with a motor 12, and detecting the polishing end point of the principal surface by monitoring the polished state of the principal surface; a process of stopping polishing of the principal surface when the polishing end point is detected, and determining the polishing time for a surface other than the principal surface, which is to be polished subsequently, on the basis of the polishing time for the principal surface which is determined when polishing is finished; and a process of polishing the surface for the determined polishing time. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006066891(A) 申请公布日期 2006.03.09
申请号 JP20050200309 申请日期 2005.07.08
申请人 TOSHIBA CORP;EBARA CORP 发明人 SHIGETA ATSUSHI;TOYODA GEN;YANO HIROYUKI;OISHI KUNIO;ITO KENYA;NAKANISHI MASAYUKI;YAMAGUCHI KENJI
分类号 H01L21/304;B24B9/00;B24B37/013;B24B37/04 主分类号 H01L21/304
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