发明名称 METHOD FOR FORMING POLYCRYSTALLINE SILICON THIN FILM TRANSISTOR
摘要 A method for forming a polycrystalline silicon thin film transistor. The method includes the steps of: forming a polycrystalline silicon layer including multiple protrusions by crystallizing the amorphous silicon layer according to a crystallization method in which the multiple protrusions are formed due to collision between crystal grains; patterning the polycrystalline silicon layer in an active pattern which includes only two protrusions of the multiple protrusions, which are apart from each other and located at both sides of a gate electrode-forming area; applying a barrier layer on the patterned polycrystalline silicon layer while partially covering the two protrusions; and forming a source electrode and a drain electrode at the protrusions of the polycrystalline silicon layer formed at both sides of the gate electrode-forming area by ion-implanting dopants into a resultant lamination.
申请公布号 US2006051904(A1) 申请公布日期 2006.03.09
申请号 US20050085953 申请日期 2005.03.22
申请人 BOE HYDIS TECHNOLOGY CO., LTD. 发明人 SON KYOUNG S.;RYU MYUNG K.;PARK JAE C.;KIM EOK S.;LEE JUN H.;KWON SE Y.;IM JANG S.
分类号 H01L21/84;H01L21/20 主分类号 H01L21/84
代理机构 代理人
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