| 摘要 |
A chip tester is mounted on a circuit board for testing validity of a chipset includes a base member that receives the chipset thereon and that has a plurality of testing contacts in electrical communication with the circuit board and, and a top cover that is mounted on the base member to confine the chipset therebetween and has a test opening for access to the chip set. When the chipset is confined between the top cover and the base member, electrical contacts of the chipset are in contact with the testing contacts in the base member.
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