Computer memory chip testing method in which an external test unit is used and test data written to reference and test registers prior to a bit by bit comparison of the two

摘要

Method for testing a data memory (1) using an external test unit (2) that has a display for indicating if memory errors are present involves writing of test data to the memory and then to a reference register and a test data register, bit by bit comparison of reference and test registers, storage of an indicator date if no error exists and overwriting of the stored data if a data error is indicated and finally repetition of the previous steps with further test data sequences. An independent claim is made for a data memory with integral error indicator arrangement.