发明名称 Method and apparatus for testing circuit boards
摘要 The invention provides a method of apparatus for testing circuit boards which does not require any inner wide power plane so as to detect an open circuit defect and/or a short circuit defect in a conductor path network formed in the circuit board quickly and accurately. An apparatus for testing a circuit board according to the present invention comprises a transmission unit ( 2 ) for transmitting electromagnetic (radio) wave signal by way of an antenna ( 1 ) to a circuit board ( 3 ) to be tested, a detecting unit ( 3 ) for detecting signal received by a conductor path ( 4 ) of the circuit board ( 3 ) by using the conductor path ( 4 ) as a receiving antenna, and compare unit ( 8 ) for determining whether or not there is an open circuit defect or a short circuit defect in the conductor path ( 4 ) by comparing the detected signal with reference data of corresponding to a conductor path not including any defect.
申请公布号 US2006052957(A1) 申请公布日期 2006.03.09
申请号 US20040923446 申请日期 2004.08.20
申请人 HIDEHIRA YORIO 发明人 HIDEHIRA YORIO
分类号 G01R31/00;G06F19/00 主分类号 G01R31/00
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