发明名称 DESIGNING METHOD OF ILLUMINATION LIGHT SOURCE, MASK PATTERN DESIGNING METHOD, PHOTO MASK MANUFACTURING METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To provide the designing method of an illumination light source that can make a degree of light exposure margin optimal. <P>SOLUTION: The designing method of an illumination light source comprises steps of setting a management figure to be used for dimensional control of the transfer pattern of a mask pattern, setting a plurality of lighting elements for lighting the mask pattern, setting a first illumination light to a first polarized state of the light emitted from each of the plurality of illumination elements, calculating a first optical image of the management figure formed on a first imaging surface by each of the first illumination lights, and determining an illumination shape of light and a polarized state distribution based on the optical characteristics of the first optical image. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006066440(A) 申请公布日期 2006.03.09
申请号 JP20040243874 申请日期 2004.08.24
申请人 TOSHIBA CORP 发明人 FUKUHARA KAZUYA
分类号 H01L21/027;G03F1/36;G03F1/68;G03F7/20 主分类号 H01L21/027
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