发明名称 PHASE SHIFT MASK AND EXPOSURE METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a phase shift mask for achieving a large depth of focus when a transparent insulating substrate is exposed to transfer a fine line-and-space pattern. <P>SOLUTION: The purpose of the phase shift mask is to transfer a line-and-space pattern by an actual size projection exposure using a mask pattern having a phase shifter 11 which inverts the phase of light but without using a light shielding film. When the line-and-space pattern has 0.5 &mu;m to 0.8 &mu;m line width L and 2L pitch, the mask pattern consists of linear phase shifters 11 arranged in parallel to each other with 0.5L to 0.75L width W and 2L pitch P. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006064968(A) 申请公布日期 2006.03.09
申请号 JP20040246897 申请日期 2004.08.26
申请人 ADVANCED LCD TECHNOLOGIES DEVELOPMENT CENTER CO LTD 发明人 YAMAGUCHI HIROTAKA
分类号 G03F1/34;G03F1/68;G03F7/20;H01L21/027 主分类号 G03F1/34
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