摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a probe needle capable of easily forming a beam of an arbitrary complicated shape. <P>SOLUTION: In the method of manufacturing the probe needle having the beam and a contact disposed at the tip of the beam, an Si wafer 20 is prepared, a seed layer 21 is formed on the Si wafer 20, and a groove having a desired shape of the beam is formed on the layer by patterning a photo resist 23. After that, the shape of a desired beam is formed by burying the groove with metal plating layers 24a and 24b. <P>COPYRIGHT: (C)2006,JPO&NCIPI |