发明名称 PROBE NEEDLE, METHOD OF MANUFACTURING PROBE NEEDLE, AND METHOD OF MANUFACTURING THREE DIMENSIONAL SOLID STRUCTURE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a probe needle capable of easily forming a beam of an arbitrary complicated shape. <P>SOLUTION: In the method of manufacturing the probe needle having the beam and a contact disposed at the tip of the beam, an Si wafer 20 is prepared, a seed layer 21 is formed on the Si wafer 20, and a groove having a desired shape of the beam is formed on the layer by patterning a photo resist 23. After that, the shape of a desired beam is formed by burying the groove with metal plating layers 24a and 24b. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006064676(A) 申请公布日期 2006.03.09
申请号 JP20040251081 申请日期 2004.08.30
申请人 TOKYO ELECTRON LTD 发明人 HOSHINO TOMOHISA;HASHIMOTO HIROYUKI;HARADA MUNEO
分类号 G01R1/067;G01R1/073;G01R31/26 主分类号 G01R1/067
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