发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a MIS transistor having high switching characteristics by reducing switching charge (Q<SB>sw</SB>) between a gate and a drain while suppressing on-resistance (R<SB>on</SB>). SOLUTION: The MIS transistor comprises a drain layer 20, a base layer 30 which has a channel end 30a and is laminated on the drain layer 20, a source layer 40 which has a source end 40a connected with the channel end 30a and is laminated on the base layer 30, a gate insulating film 700 which is formed continuously along the channel end 30a and the source end 40a, a gate electrode 80 which is provided opposite to the channel end 30a across the gate insulating film 700, and a cavity 750 which is formed on the drain layer 20 below the gate electrode 80 and opposed to the gate electrode 80. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006066611(A) 申请公布日期 2006.03.09
申请号 JP20040246887 申请日期 2004.08.26
申请人 TOSHIBA CORP 发明人 MATSUDA NOBORU;TAKAHASHI KOICHI;KAWAMURA KEIKO;TSUCHIYA MASANOBU
分类号 H01L29/78 主分类号 H01L29/78
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