发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can prevent signal wiring from being affected by adverse effects due to the capacitance. SOLUTION: The semiconductor device includes terminals of a high reference potential (Vdd) and a low reference potential (Vss) which constitute a voltage of power source; a first MOS capacitance (813), where the gate of a p-channel MOSFET is connected with the terminal of the low reference potential, and a source and drain are connected with the terminal of the high reference potential; and first signal wiring (201) which is connected with the gate through a parasitic capacitance (202), and the signal of the low reference potential is supplied, when the power source starts. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006066823(A) 申请公布日期 2006.03.09
申请号 JP20040250632 申请日期 2004.08.30
申请人 FUJITSU LTD 发明人 OKUDA MASAKI
分类号 H01L27/04;H01L21/82;H01L21/822;H01L21/8234;H01L27/06;H01L27/088 主分类号 H01L27/04
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