发明名称 Manufacture of insulated gate type field effect transistor
摘要 After a field insulating film having an element opening is formed on the surface of a p-type well, a gate insulating film is formed on a semiconductor surface in the element opening. A gate electrode layer of polysilicon or the like is formed on the insulating film. By using as a mask a lamination of the electrode layer and gate insulating film and the field insulating film, an ion implantation process is executed to form n<SUP>+</SUP>-type source and drain regions. After the electrode layer is made narrow and thin by an isotropic etching process, n<SUP>-</SUP>-type source and drain regions are formed by an ion implantation process using as a mask the lamination of the electrode layer and gate insulating film and the field insulating film.
申请公布号 US2006051927(A1) 申请公布日期 2006.03.09
申请号 US20050219567 申请日期 2005.09.02
申请人 YAMAHA CORPORATION 发明人 TAKAMI SYUUSEI
分类号 H01L21/336;H01L21/3205;H01L21/8238 主分类号 H01L21/336
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