| 摘要 |
PROBLEM TO BE SOLVED: To provide an electronic device being tested at high speeds through the use of a conventional testing apparatus. SOLUTION: The electronic device to be tested by an external testing apparatus is provided with: a pattern generating part for generating predetermined test patterns; a circuit part to be tested and operated according to a supplied signal; and a test pattern selecting part for supplying a test pattern provided from the testing apparatus for the circuit part to be tested in the case where the electronic device is operated at a predetermined frequency and tested, and for supplying a test pattern generated by the pattern generating part for the circuit part to be tested in the case where the electronic device is operated at a frequency higher than the predetermined frequency and tested. COPYRIGHT: (C)2006,JPO&NCIPI
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