| 摘要 |
PROBLEM TO BE SOLVED: To accurately and simply measure the weight per unit area and/or the thickness of each layer of a double-layer film sheet in a running state by using an X-ray inspection method. SOLUTION: When measuring each layer 10a, 10b of the double-layer film sheet in the running state of the double-layer film sheet 10, transmitted X-ray quantities through approximately the same parts of the double-layer film sheet are measured by using a high-energy X-ray source 11 and a low-energy X-ray source 12, and each measured output is data-processed by an operation part 30, to thereby calculate the weight per unit area and/or the thickness of each layer approximately continuously. COPYRIGHT: (C)2006,JPO&NCIPI
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