发明名称 METHOD OF INSPECTING THERMAL HEAD
摘要 PROBLEM TO BE SOLVED: To provide a thermal head having a pad section p hardly causing occurrence of defective measurement and a method of inspecting a characteristic of the thermal head. SOLUTION: The thermal head comprises a substrate 1, heating elements 3 arranged on the substrate 1, electrode wires electrically connected to the heating elements 3, the pad section P through which a heating control signal is input to a part of the electrode wires, and a resist film "r" adhered to the pad section P. There is disclosed the method of inspecting and measuring the electric characteristic of the thermal head by bringing a probe needle "n" into contact with the pad section P. Irregularities "t" are formed on the surface of the pad section P. When inspecting and measuring is carried out, the probe needle "n" is pressed against the pad section P to remove the resist film "r" adhered to the surface of the irregularities "t" to energize the electrode wire to the probe needle "n", thereby inspecting and measuring the electric characteristic. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006062145(A) 申请公布日期 2006.03.09
申请号 JP20040245504 申请日期 2004.08.25
申请人 KYOCERA CORP 发明人 NIWA YOSHIHIRO
分类号 B41J2/345;B41J2/335;B41J2/35 主分类号 B41J2/345
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