发明名称 Tft electronic devices and their manufacture
摘要 An electronic device ( 70 ) comprises a thin film transistor (TFT) ( 9,59 ), the TFT including a channel ( 16 ) defined in a layer of polycrystalline semiconductor material ( 10,48 ). The polycrystalline semiconductor material is produced by crystallising amorphous semiconductor material ( 2 ) using metal atoms ( 6 ) to promote the crystallisation process. The polycrystalline semiconductor material ( 10 ) includes an average concentration of metal atoms in the range 1.3x10<SUP>18 </SUP>to 7.5x10<SUP>18 </SUP>atoms/cm<SUP>3</SUP>. This enables polycrystalline semiconductor TFTs to be formed with leakage properties acceptable for use in active matrix displays using a metal induced crystallisation process of duration significantly less that previously thought necessary. Furthermore, this process duration reduction facilitates the reliable fabrication of poly-Si TFTs having bottom gates formed of metal.
申请公布号 US2006049428(A1) 申请公布日期 2006.03.09
申请号 US20050520229 申请日期 2005.01.03
申请人 VAN DER ZAAG PIETER J;YOUNG NIGEL D;FRENCH IAN D;CHAPMAN JEFFREY A 发明人 VAN DER ZAAG PIETER J.;YOUNG NIGEL D.;FRENCH IAN D.;CHAPMAN JEFFREY A.
分类号 H01L21/20;H01L29/76;H01L21/336;H01L29/745;H01L29/786 主分类号 H01L21/20
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