发明名称 |
Tft electronic devices and their manufacture |
摘要 |
An electronic device ( 70 ) comprises a thin film transistor (TFT) ( 9,59 ), the TFT including a channel ( 16 ) defined in a layer of polycrystalline semiconductor material ( 10,48 ). The polycrystalline semiconductor material is produced by crystallising amorphous semiconductor material ( 2 ) using metal atoms ( 6 ) to promote the crystallisation process. The polycrystalline semiconductor material ( 10 ) includes an average concentration of metal atoms in the range 1.3x10<SUP>18 </SUP>to 7.5x10<SUP>18 </SUP>atoms/cm<SUP>3</SUP>. This enables polycrystalline semiconductor TFTs to be formed with leakage properties acceptable for use in active matrix displays using a metal induced crystallisation process of duration significantly less that previously thought necessary. Furthermore, this process duration reduction facilitates the reliable fabrication of poly-Si TFTs having bottom gates formed of metal.
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申请公布号 |
US2006049428(A1) |
申请公布日期 |
2006.03.09 |
申请号 |
US20050520229 |
申请日期 |
2005.01.03 |
申请人 |
VAN DER ZAAG PIETER J;YOUNG NIGEL D;FRENCH IAN D;CHAPMAN JEFFREY A |
发明人 |
VAN DER ZAAG PIETER J.;YOUNG NIGEL D.;FRENCH IAN D.;CHAPMAN JEFFREY A. |
分类号 |
H01L21/20;H01L29/76;H01L21/336;H01L29/745;H01L29/786 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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