发明名称 |
COMPOUND SEMICONDUCATOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
The method is useful to manufacture laser diodes, monitoring photodiodes, and receiving photodiodes on the same substrate. The method comprises (A) forming a p-type clad layer (23) on a p-type semiconductor substrate and a p-type or n-type active region (25); (B) forming an n-type clad layer (27) and an n-type cap layer (29) using LPE and MBE; (C) forming an n-type electrode (31) on the cap layer (29) and a p-type electrode (33) beneath the substrate; (D) forming a photo-mask pattern on the n-type electrode; (E) ion beam etching of the substrate to the desired depth perpendicular to the substrate.
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申请公布号 |
KR940008562(B1) |
申请公布日期 |
1994.09.24 |
申请号 |
KR19910012537 |
申请日期 |
1991.07.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
MUN, SUNG - HWAN |
分类号 |
H01L21/66;H01L31/10;H01L31/12;H01L31/173;H01L33/00;H01S5/00;H01S5/026;(IPC1-7):H01L27/06 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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