| 摘要 |
<p>PROBLEM TO BE SOLVED: To prevent a whole-function stop of an electron-emission element even when the interval between electrodes, to which a high voltage to extract electrons is applied, is short circuited, in an electron-emission element from which electrons are emitted by a field emission. SOLUTION: In the electron-emission element in which electrons are emitted from respective emitters 4 with the aid of a strong electric field formed between a gate electrode 3 and the emitters 4, by applying a voltage between the gate electrode 3 and the emitters 4 which are arranged adjacently to the gate electrode 3 through minute space, thin-filmed parts are formed in the gate electrode 3 to thereby form easy to melt parts 8.</p> |
