发明名称 |
Capacitor electrode for a ferroelectric memory cell and method for fabricating the same |
摘要 |
<p>A semiconductor memory device comprises an interlayer insulating film (14) formed on a semiconductor substrate; a contact plug (15) formed to extend through the interlayer insulating film; and a capacitor formed on the interlayer insulating film, an electrode (16) of the capacitor being connected with the contact plug, wherein the electrode has an iridium oxide film (16b) as an oxygen barrier film, and the iridium oxide film has a plurality of layers different in average crystal grain size from each other.</p> |
申请公布号 |
EP1632990(A2) |
申请公布日期 |
2006.03.08 |
申请号 |
EP20050026388 |
申请日期 |
2002.05.24 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
NASU, TORU;NAGANO, YOSHIHISA |
分类号 |
H01L21/02;H01L21/8246;H01L21/8247;H01L27/115 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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