发明名称 Integrated circuit wafer packaging system and method
摘要 <p>A packaging system, hereinafter referred to as the Critical Packaging System, relates to critical issues that associate with sensitive articles such as IC wafers before, during and after shipment phases. The system employs a choice of two or more specialty designed containers, and any one selected design having choices of two or more methods by which to avoid, reduce and/or eliminate wafer damage from breakage, scratches and/or corrosion during shipment phases. For the purpose of maximizing product yield during packaging phases a special apparatus is used to insert wafers within containers without scratch damage. The following programs are used in packaging: (1) Quality Assurance/Certification, (2) Critical Factor Monitoring, and (3) a Recycle and Refurbish Program. These programs are specifically designed to achieve new levels of product yields, reduce product cost, and landfill impact.</p>
申请公布号 EP1603156(A3) 申请公布日期 2006.03.08
申请号 EP20050000848 申请日期 2005.01.17
申请人 CONVEY INCORPORATED 发明人 BROOKS, RAY G.;BROOKS, TIMOTHY W.
分类号 B65D57/00;H01L21/68;B65D21/02;B65D81/07;B65D81/26;B65D85/86;B65G49/07;H01L21/673;H01L21/677 主分类号 B65D57/00
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