发明名称 System and method for one-time programmed memory through direct-tunneling oxide breakdown
摘要 A one-time programming memory element, capable of being manufactured in a 0.13 mum or below CMOS technology, having a capacitor, or transistor configured as a capacitor, with an oxide layer capable of passing direct gate tunneling current. Also included is a write switch, having first and second switches coupled to the capacitor, and a read switch also coupled to the capacitor. The capacitor/transistor is one-time programmable as an anti-fuse by application of a program voltage across the oxide layer via the write switch to cause direct gate tunneling current to rupture the oxide layer to form a conductive path having resistance of approximately hundreds of ohms or less.
申请公布号 US7009891(B2) 申请公布日期 2006.03.07
申请号 US20050132335 申请日期 2005.05.19
申请人 BROADCOM CORPORATION 发明人 CHEN VINCENT;CHEN HENRY;TSAU LIMING;SHIAU JAY;BATTACHARYA SURYA;ITO AKIRA
分类号 H01L29/00;G11C7/00;G11C17/00;G11C17/18;H01L27/112 主分类号 H01L29/00
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