发明名称 Semiconductor over-voltage protection structure for integrated circuit and for diode
摘要 A monolithically integratable semiconductor structure serves for over-voltage protection in an integrated circuit or as a normal diode. The structure includes an insulating layer between a substrate and a semiconductor layer of first conductivity type, and several layers formed in the semiconductor layer. First and second layers of second conductivity type are spaced apart from one another. A third layer of first conductivity type contacts the second layer. A fourth layer of first conductivity type directly contacts and surrounds the second and third layers. A fifth layer of first conductivity type and higher dopant concentration than the semiconductor layer is disposed under the first layer. The first layer surrounds the second, third and fourth layers essentially in a ring-shape. A first electrode contacts the first layer. A second electrode contacts the second and third layers.
申请公布号 US7009256(B2) 申请公布日期 2006.03.07
申请号 US20040945719 申请日期 2004.09.20
申请人 ATMEL GERMANY GMBH 发明人 DIETZ FRANZ;GRAF MICHAEL
分类号 H01L23/62;H01L23/60;H01L27/02;H01L27/082;H01L27/12;H01L29/76 主分类号 H01L23/62
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